He, K., Zhang, X., Ren, S., & Sun, J. (2016). **Deep residual learning for image recognition**. In *Proceedings of the IEEE conference on computer vision and pattern recognition* (pp. 770-778).
[PDF](https://arxiv.org/pdf/1512.03385.pdf)
for even more check [this page](https://gitlab.cl.uni-heidelberg.de/jmrs/caption/wikis/organization/resources) out
## LICENSE
This project is licensed under the MIT License - see the [LICENSE](LICENSE) file for details